[DSE] Add test for potential caching bug (NFC)
This one would miscompile if read-clobber checks switched to using the EarlierAccess location, but the read cache was retained.
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@ -96,3 +96,36 @@ else:
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load i8, i8* %a1
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ret void
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}
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; Variation on the previous test case, where only the store to %a0 is dead,
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; but not the one to %a1. This tests for a potential caching bug.
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define void @test4(i1 %c) {
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; CHECK-LABEL: @test4(
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; CHECK-NEXT: [[A:%.*]] = alloca [2 x i8], align 1
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; CHECK-NEXT: [[A0:%.*]] = getelementptr [2 x i8], [2 x i8]* [[A]], i32 0, i32 0
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; CHECK-NEXT: [[A1:%.*]] = getelementptr [2 x i8], [2 x i8]* [[A]], i32 0, i32 1
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; CHECK-NEXT: store i8 1, i8* [[A1]], align 1
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; CHECK-NEXT: store i8 1, i8* [[A0]], align 1
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; CHECK-NEXT: br i1 [[C:%.*]], label [[IF:%.*]], label [[ELSE:%.*]]
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; CHECK: if:
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; CHECK-NEXT: store [2 x i8] zeroinitializer, [2 x i8]* [[A]], align 1
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; CHECK-NEXT: br label [[ELSE]]
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; CHECK: else:
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; CHECK-NEXT: [[TMP1:%.*]] = load i8, i8* [[A1]], align 1
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; CHECK-NEXT: ret void
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;
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%a = alloca [2 x i8]
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%a0 = getelementptr [2 x i8], [2 x i8]* %a, i32 0, i32 0
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%a1 = getelementptr [2 x i8], [2 x i8]* %a, i32 0, i32 1
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store i8 1, i8* %a1
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store i8 1, i8* %a0
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br i1 %c, label %if, label %else
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if:
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store [2 x i8] zeroinitializer, [2 x i8]* %a
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br label %else
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else:
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load i8, i8* %a1
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ret void
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}
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